Isra Solar Vision Presents a New Generation EL Inspection for Solar Modules

Veröffentlicht auf 12.10.2012

Isra Solar Vision presents a new generation EL inspection for solar modules. The technology provides fast electroluminescence inspection with accurate defect classification resulting in the low false detection and false downgrading rates. Solar manufacturers benefit from the application of the new solarscan-Yieldmaster  EL inspection through a reduced production of defective or underperforming cells and modules. This leads to a three percent increase in maximum-quality yield and remarkable cost savings through less material loss. This way, the innovative inspection technologies support the PV industry in fully exploiting all cost-saving and efficiency-raising potentials.

Isra Solar Vision's new generation of in-line Yieldmaster EL-Module inspection systems is able to detect and classify a large spectrum of attributes including visible and invisible cracks, shunts, dark and in-active cells, scratches, broken pieces, pollution, material defects and soldering defects on solar modules. In addition, the system provides the characterization of cells and modules in industrial mass production with unrivaled detection rates and repeatability. Solar module manufacturer benefit from this revolutionary technology as it allows high reliable distinction between material defects such as dislocations, changes in the material, foreign objects, and process defects (cracks, finger interruptions, low efficiency regions, mechanically broken cells, soldering and contact issues, low efficiency cells etc.).

Making the Invisible Visible at High Inspection Speeds

One of improvements of Yieldmaster EL inspection is fast image processing. Conventional EL systems require long cycle times for image capture and analysis. For the new EL method Isra Solar Vision managed to reduce the imaging time by a factor of eight. The inspection system boosts image acquisition and calculation to an overall triple inspection speed and by that offers the fastest EL inspection systems for solar modules.

Accurate Defect Classification for a 3% Increase of A-Grade Yield

Another quantum leap in electroluminescence inspection is the hign measurement accuracy that decreases the false detection rate by a factor of more than six, down to under 0.5 percent. Due to poor detection rates, EL systems that are currently available on the market waste too much material. However, solarscan-Yieldmaster EL-Module discriminates electrical defects from non-critical optical effects resulting in significantly less false downgrading of immaculate solar modules. This way, the new inspection technology enables solar module manufacturers to boost A-grade yield by up to three percent. This innovation opens up new dimensions to increase production efficiency in terms of reduced manufacturing costs and enhanced product quality. The return on investment can be achieved within less than three months.

Inspection at High Speed and Accuracy for Best Quality Si Solar Module Production

The modular architecture of the new electroluminescence system allows the integration into new or existing production lines and fulfills varying inspection requirements for solar cells. Overall Yieldmaster EL Module inspection increases the yield of A-grade modules by three percent and improves overall yield through triple inspection speed. At the same time material loss is reduced by a factor of six. Thus automated electroluminescence inspection with Isra Solar Vision technologies leads to significant cost savings, increased productivity and eventually to higher customer satisfaction. This way, Yieldmaster EL Module inspection enables solar manufacturers to achieve higher quality products, lower production losses and altogether results in an increased efficiency in Si solar module production.


Quelle: Isra Solar Vision
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